Full Description

Sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorous, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel, expressed as the oxides on an as-received basis.

Product Details

Published: 01/01/1997File Size: 1 file , 160 KB